NS200 Stylus Nano Profiler
Supplied, sold and supported by Petrano Supply Inc. in Canada.
Contact stylus profiler for nanometre-scale step height, roughness and contour.
Overview
The NS200 stylus nano profiler measures step height, surface roughness and contour by contact scanning, complementing optical methods on films, coatings and machined surfaces.
Applications
- Thin films and coatings
- Semiconductor process control
Key specifications
| Measurement type | Contact stylus profilometry |
|---|---|
| Measurands | Step height, roughness, contour |
| Full specifications | Confirmed at quotation with the manufacturer TDS |
Specifications are provided by the manufacturer, are for general information only, may change without notice, and are confirmed at quotation.
Third-party brands are used for identification only unless an authorized relationship is expressly stated.
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